Cranfield National Manufacturing Debate 2017

Posted on 5 May 2017 by The Manufacturer

Leadership and investment for manufacturing skills will be the focus of the eighth annual National Manufacturing Debate, due to be held at Cranfield University on Wednesday 24 May.

Cranfield University National Manufacturing Debate
Now in its eighth year, the National Manufacturing Debate (NMD) is always based around a critical topic – image courtesy of Cranfield University.

Cranfield’s National Manufacturing Debate brings together manufacturing professionals from a range of sectors to discuss and debate the current challenges in the industry. The event also encourages networking and collaboration across the sector to enable continued and long-term growth.

Following on from 2016’s topic – How can UK manufacturing growth match the best of the G7?, this year’s event will focus on the importance of Leadership and investment for manufacturing skills.

Within this central theme, the debate will address:

  • What is the current UK manufacturing skills requirement across sectors? And how we compare against G7 countries?
  • How the skills requirement is going to change in the future?
  • Do we have the right leadership to provide the skills to UK manufacturing companies?
  • Are we investing enough to deliver the future skills requirement?
  • What should we do to achieve the skills required for UK manufacturing?

Overseen by chair Lord Alec Broers, the topic will be examined from a number of high-profile figures from industry, government and academia, including:

  • Neil Carberry, director – people and skills, CBI
  • Chris White MP, co-chair, All-Party Parliamentary Manufacturing Group (APMG)
  • James Selka, CEO, Manufacturing Technologies Association (MTA)
  • Allan E Cook CBE DSc, chairman, Atkins
  • Mike Rigby, head of manufacturing, Barclays
  • Ken Olisa, chairman, Restoration Partners

National Manufacturing Debate 2017

24 May: 08:30 – 16:00

Vincent Building, Cranfield University – MK43 0AL

Click here to register for the event.